Quantum Material Characterization
State-of the-art facilities with characterization equipment ranging from basic material properties to optical and electrical evaluation of quantum devices.
Structural and Chemical Characterization;
- Advanced electron microscopes that allow material characterization down to atomic resolution: Environmental and Analytical TEM, SEM, Plasma FIB SEM, EBSD, TKD, AFM, XPS, XRD, KPFM, MFM
- Optical confocal and interference microscopes, tactile profilometer as well as in-house developed theory, modelling, and highly customized setups for optical nanoscale measurements (Mueller polarimetry and scatterometry).
Optical and Electrical Characterization;
- Test benches for quantum materials, quantum components and complete quantum systems including quantitative nanoscale tests of qubit materials in 1D, 2D and planar structures as well as tests of optical components and systems for e.g. quantum communication and photonic quantum computation.
- Quantitative tests for components and systems for quantum communication and quantum computing include tests for lasers, single-photon sources, fiber optics as well as electro-optical modulators, amplifiers, homodyne detectors, single photon detectors and an optical frequency comb.
- Various reference standards (e.g. gratings, step heights, material standards, roughness standards and nano particles) to ensure traceability of the above mentioned instruments.
- 3D imaging using x-rays and neutrons.
For detailed information on capabilities and access, contact us or explore the test sites by yourself:
Contact
Olnur Akseki Jørgensen
Program Coordinator
Blegdamsvej 17, 2100 København Ø.
Mobile: +45 51 68 04 90
E-mail: DIANAQ@nbi.ku.dk